Wafer

 

Test Item

Test Standard

MTTF
Operation Lifetime Test (OLT)
ESD
Human Body Model (HBM)
MIL-STD-883F Method 3015.7
Machine Model (MM)
JEDEC EIA/JESD22-A115-A
Package

 

Test Item
Test Standard
Precondition
Test
Temperature Cycling Test (TCT)
J-STD-020C
Bake
Temperature Humidity Storage Test (THT)
IR Reflow
Reliability
Test
Temperature Cycling Test (TCT)
JESD22-A102C
Pressure Cooker Test (PCT)
JESD22-A104C
High Temperature Storage Life Test (HTST)
JESD22-A103B
Temperature Humidity Storage Test (THT)
JESD22-A101B
Solderability Test
JESD22-B106B
Solder-Heat Test
JESD22-B102C